Strain Effects in p-type Devices using Full-Band Monte Carlo Simulations

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Bibliographic Details
Main Authors: Aubry-Fortuna, Valérie, Huet, Karim, Nghiêm, T.T. Trang, Bournel, Arnaud, Saint-Martin, Jérôme, Dollfus, Philippe
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2011
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Online Access:https://www.intechopen.com/chapters/14001
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