New horizons in testing latent trait test theory and computerized adaptive testing

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Bibliographic Details
Corporate Authors: United States, Computerized Adaptive Testing Conference (1979 : Wayzata, Minn)
Other Authors: Weiss, David J., Bock, R. Darrell
Format: Book
Language:English
Published: New York Academic Press 1983
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Matheson Library

Holdings details from Matheson Library
Call Number: 153.93 N532
Copy 039061 On Shelf