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New horizons in testing latent trait test theory and computerized adaptive testing

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Bibliographic Details
Corporate Authors: United States, Computerized Adaptive Testing Conference (1979 : Wayzata, Minn)
Other Authors: Weiss, David J., Bock, R. Darrell
Format: Book
Language:English
Published: New York Academic Press 1983
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Description
Item Description:Derived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al
Physical Description:xvii, 345 p. ill 24 cm.