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Rational fault analysis

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Bibliographic Details
Corporate Authors: Symposium on Rational Fault Analysis (1974 : Texas Tech University), United States, United States. Army Research Office
Other Authors: Liberty, Stanley R., 1942-, Saeks, Richard, 1941-
Format: Book
Language:English
Published: New York M. Dekker c1977
Series:Electrical engineering and electronics 1
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245 1 0 |a Rational fault analysis  |c edited by Richard Saeks, Stanley R. Liberty 
260 0 0 |a New York  |b M. Dekker  |c c1977 
300 0 0 |a ix, 241 p.  |b ill.  |c 24 cm. 
440 0 0 |a Electrical engineering and electronics  |v 1 
500 0 0 |a Co-sponsored by the Office of Naval Research and the Army Research Office 
518 0 0 |a "This volume represents the proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August19-20, 1974". 
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650 0 0 |a Electronic apparatus and appliances  |x Testing 
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700 1 0 |a Saeks, Richard,  |d 1941- 
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