Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 /

Enregistré dans:
Détails bibliographiques
Collectivité auteur: Institution of Electrical Engineers
Format: Livre
Langue:anglais
Publié: London and New York : Institution of Electrical Engineers, c1979.
Collection:I.E.E. conference publication ; no. 174
Sujets:
Electronic instruments.
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!

MARC

LEADER 00000nam a2200000 4500
001 00112127
003 PWmBRO
005 20240602103056.0
008 960522s1979 enka b 10010 eng
020 |a 0852962045 
245 0 0 |a Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 /  |c organised by the Institution of Electrical Engineers, ... [et al.]. 
260 0 |a London and New York :  |b Institution of Electrical Engineers,  |c c1979. 
300 |a vii, 157 p. :  |b ill. 
490 0 |a I.E.E. conference publication ; no. 174 
650 0 |a Electronic instruments. 
710 0 |a Institution of Electrical Engineers. 
740 0 |a Electronic test and measuring instrumentation--Testmex 79. 
942 |2 ddc 
952 |0 0  |1 127  |4 0  |6 621_381548000000000_C748  |7 0  |8 MN  |9 92023  |a ML015  |b ML015  |c MN  |d 2024-06-02  |l 0  |o 621.381548 C748  |p 115403  |r 2018-03-27 00:00:00  |w 2018-03-27  |y BK 
999 |c 69870  |d 69870 

Documents similaires