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Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 /
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| Corporate Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
London and New York :
Institution of Electrical Engineers,
c1979.
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| Series: | I.E.E. conference publication ; no. 174
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| Subjects: | |
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