Odonkor, P., & Honu, E. (2025). Characterizing Cyber-Physical System Testbeds as Design Artifacts: A Morphological Analysis Across Application Domains. IEEE.
Chicago Style (17th ed.) CitationOdonkor, Philip, and Evans Honu. Characterizing Cyber-Physical System Testbeds as Design Artifacts: A Morphological Analysis Across Application Domains. IEEE, 2025.
MLA (9th ed.) CitationOdonkor, Philip, and Evans Honu. Characterizing Cyber-Physical System Testbeds as Design Artifacts: A Morphological Analysis Across Application Domains. IEEE, 2025.
Warning: These citations may not always be 100% accurate.