Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry

Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry

In this work, the insensitive layer thickness of a PIN photodiode (SFH206K - Osram) has been measured by varying the incident angle of a collimated monoenergetic alpha particle beam. This technique is based on the fact that, except for the intrinsic uncertainties of the emission and straggling of al...

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Bibliographic Details
Main Authors: Josemary A. C. Gonçalves, Carmen Cecília Bueno, Fabio de Camargo, Kelly Pascoalino
Format: Article
Language:English
Published: Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR) 2022-12-01
Series:Brazilian Journal of Radiation Sciences
Subjects:
alpha spectrometry
si diode
pin photodiode
Online Access:https://bjrs.org.br/revista/index.php/REVISTA/article/view/1789
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