Collaborative Optimization of Equipment Reliability and Testability Considering BIT Characteristics
In order to optimize and balance the reliability and testability of modern equipment, a collaborative optimization method of equipment reliability and testability considering the characteristics of BIT (Built In Test) is proposed The BIT characteristic model, reliability model and testability mod...
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| Main Authors: | , , , |
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| 格式: | Article |
| 語言: | 中文 |
| 出版: |
Harbin University of Science and Technology Publications
2023-04-01
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| 叢編: | Journal of Harbin University of Science and Technology |
| 主題: | |
| 在線閱讀: | https://hlgxb.hrbust.edu.cn/#/digest?ArticleID=2192 |
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| 總結: | In order to optimize and balance the reliability and testability of modern equipment, a collaborative optimization method of equipment reliability and testability considering the characteristics of BIT (Built In Test) is proposed The BIT characteristic model, reliability model and testability model of equipment are established Established the number of BITs as decision variables, equipment reliability index minimum requirements as constraint conditions, the testability index as the optimization goal of equipment testability optimization model and the number of BITs as decision variables, equipment reliability index minimum requirements and testability index minimum requirements as constraint conditions, the reliability index and testability index weighted summation of the results as the optimization goal of equipment reliability and testability collaborative optimization model. By solving the model, the optimal number of BITs, reliability index and testability index of equipment are calculated. Taking radar as an example, the simulation results of equipment reliability and testability collaborative optimization are given: when the number of BITs is set to 48, the equipment reliability is 0.821 and the fault diagnosis rate is 88.2%, which provides a reference for determining the reasonable number of bits for different equipment to achieve the balance of reliability and testability optimization. |
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| ISSN: | 1007-2683 |