APA (7th ed.) Citation

Xie, S., Meng, Y., Bland-Hawthorn, J., Veilleux, S., & Dagenais, M. (2018). Silicon Nitride/Silicon Dioxide Echelle Grating Spectrometer for Operation Near 1.55 μm. IEEE.

Chicago Style (17th ed.) Citation

Xie, Shengjie, Yang Meng, Joss Bland-Hawthorn, Sylvain Veilleux, and Mario Dagenais. Silicon Nitride/Silicon Dioxide Echelle Grating Spectrometer for Operation Near 1.55 μm. IEEE, 2018.

MLA (9th ed.) Citation

Xie, Shengjie, et al. Silicon Nitride/Silicon Dioxide Echelle Grating Spectrometer for Operation Near 1.55 μm. IEEE, 2018.