MDT: A simple tool to facilitate dropcasting on in situ TEM MEMS chips
In situ transmission electron microscopy with holders based on the use of micro-electromechanical systems provides valuable insights into material kinetics, yet sample preparation remains complex due to fragile silicon nitride (Si3N4) windows and the risk of leaks and contamination during dropcastin...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-09-01
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| Series: | HardwareX |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2468067225000446 |
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