Polarization Reconstruction Based on Monte Carlo Simulations for a Compton Polarimeter
State-of-the-art 2D sensitive semiconductor detectors developed within the SPARC collaboration can be utilized as dedicated Compton polarimeters in the hard X-ray regime. We report on the technique of Compton polarimetry utilizing such a detector and present a method to determine the linear polariza...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-07-01
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| Series: | Atoms |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2218-2004/13/7/65 |
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