Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting

A multiple microwave frequency measurement is experimentally demonstrated by exploiting stimulated Brillouin scattering and nonlinear fitting. Through sweeping a reference frequency during the stimulated Brillouin scattering process, the frequency information of microwave signal to be measured is de...

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Main Authors: Wenting Jiao, Ke You, Junqiang Sun
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8633926/
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author Wenting Jiao
Ke You
Junqiang Sun
author_facet Wenting Jiao
Ke You
Junqiang Sun
author_sort Wenting Jiao
collection DOAJ
description A multiple microwave frequency measurement is experimentally demonstrated by exploiting stimulated Brillouin scattering and nonlinear fitting. Through sweeping a reference frequency during the stimulated Brillouin scattering process, the frequency information of microwave signal to be measured is detected by the created mapping between the total output power of the system and the reference frequency. Nonlinear fitting is utilized to mitigate the limitation of Brillouin gain spectrum linewidth and the measurement resolution is improved significantly. The minimum distinguishable frequency interval of 18 MHz is realized with the proposed scheme, and the measurement error is less than 5 MHz with in a range of 21.42 GHz. This approach offers an effective way to implement the measurement on continuous microwave sinusoidal signal with a number of frequencies of about 1190 in photonics domain.
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spelling doaj-art-b9f0d24f79df46d59b6c9173e415b7e52025-07-01T23:41:05ZengIEEEIEEE Photonics Journal1943-06552019-01-0111111210.1109/JPHOT.2019.28973328633926Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear FittingWenting Jiao0Ke You1Junqiang Sun2https://orcid.org/0000-0002-0086-703XWuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, ChinaWuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, ChinaWuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, ChinaA multiple microwave frequency measurement is experimentally demonstrated by exploiting stimulated Brillouin scattering and nonlinear fitting. Through sweeping a reference frequency during the stimulated Brillouin scattering process, the frequency information of microwave signal to be measured is detected by the created mapping between the total output power of the system and the reference frequency. Nonlinear fitting is utilized to mitigate the limitation of Brillouin gain spectrum linewidth and the measurement resolution is improved significantly. The minimum distinguishable frequency interval of 18 MHz is realized with the proposed scheme, and the measurement error is less than 5 MHz with in a range of 21.42 GHz. This approach offers an effective way to implement the measurement on continuous microwave sinusoidal signal with a number of frequencies of about 1190 in photonics domain.https://ieeexplore.ieee.org/document/8633926/Scatteringfiber non-linear opticsmicrowave photonics signal processing
spellingShingle Wenting Jiao
Ke You
Junqiang Sun
Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting
IEEE Photonics Journal
Scattering
fiber non-linear optics
microwave photonics signal processing
title Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting
title_full Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting
title_fullStr Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting
title_full_unstemmed Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting
title_short Multiple Microwave Frequency Measurement With Improved Resolution Based on Stimulated Brillouin Scattering and Nonlinear Fitting
title_sort multiple microwave frequency measurement with improved resolution based on stimulated brillouin scattering and nonlinear fitting
topic Scattering
fiber non-linear optics
microwave photonics signal processing
url https://ieeexplore.ieee.org/document/8633926/
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