Reliability analysis based on cascaded-Foster thermal networks for systems-in-package (SiP)

This paper presents a fast and comprehensive method for reliability prediction of 3D System-in-Package (3D SiP) technologies. The proposed approach accounts for both critical wear-out failure mechanisms and mission-specific profiles. A novel reliability assessment framework is introduced to address...

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Bibliographic Details
Main Authors: Djallel Eddine Touati, Aziz Oukaira, Mohamed Ali, Ahmad Hassan, Yvon Savaria, Ahmed Lakhssassi
Format: Article
Language:English
Published: Elsevier 2025-09-01
Series:Results in Engineering
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590123025020377
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