APA (7th ed.) Citation

Pei, S., Wang, W., Hu, C., Li, K., Sun, H., Wu, M., & Lan, B. (2025). Identification of Low‐Value Defects in Infrared Images of Porcelain Insulators Based on STCE‐YOLO Algorithm. Wiley.

Chicago Style (17th ed.) Citation

Pei, Shaotong, Weiqi Wang, Chenlong Hu, Keyu Li, Haichao Sun, Mianxiao Wu, and Bo Lan. Identification of Low‐Value Defects in Infrared Images of Porcelain Insulators Based on STCE‐YOLO Algorithm. Wiley, 2025.

MLA (9th ed.) Citation

Pei, Shaotong, et al. Identification of Low‐Value Defects in Infrared Images of Porcelain Insulators Based on STCE‐YOLO Algorithm. Wiley, 2025.