Point Defect Detection and Classification in MoS<sub>2</sub> Scanning Tunneling Microscopy Images: A Deep Learning Approach

Point Defect Detection and Classification in MoS<sub>2</sub> Scanning Tunneling Microscopy Images: A Deep Learning Approach

Point defects in two-dimensional materials such as MoS<sub>2</sub> can critically impact their electronic and optoelectronic properties. Precise identification of these defects is essential for understanding defect physics and device performance. In this work, we acquire high-resolution...

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Bibliographic Details
Main Authors: Shiru Wu, Guoyang Chen, Si Shen, Jiaxu Yan
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Molecules
Subjects:
MoS<sub>2</sub>
scanning tunneling microscopy
deep learning
defect detection
convolutional neural network
Online Access:https://www.mdpi.com/1420-3049/30/12/2644
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