Do, H., Kim, I., Choi, J., & Lee, J. (2025). Unraveling the Origins of Fatigue in Hafnia Ferroelectric Capacitors. IEEE.
Chicago Style (17th ed.) CitationDo, Hyeon-Seo, Ik-Jyae Kim, Jiwoung Choi, and Jang-Sik Lee. Unraveling the Origins of Fatigue in Hafnia Ferroelectric Capacitors. IEEE, 2025.
MLA (9th ed.) CitationDo, Hyeon-Seo, et al. Unraveling the Origins of Fatigue in Hafnia Ferroelectric Capacitors. IEEE, 2025.
Warning: These citations may not always be 100% accurate.