Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing
The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model i...
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Main Authors: | Miao Cai, Daoguo Yang, Jianlin Huang, Maofen Zhang, Xianping Chen, Caihang Liang, Sau Koh, Guoqi Zhang |
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Format: | Article |
Language: | English |
Published: |
IEEE
2017-01-01
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Series: | IEEE Photonics Journal |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/7765031/ |
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