APA (7th ed.) Citation

Jiang, Y., Ariffin, S. A., & Duan, Y. (2025). Enhancement study of electronic component size measurement and defect detection based on machine vision. AIP Publishing LLC.

Chicago Style (17th ed.) Citation

Jiang, Yi, Shamsul Arrieya Ariffin, and Yanbei Duan. Enhancement Study of Electronic Component Size Measurement and Defect Detection Based on Machine Vision. AIP Publishing LLC, 2025.

MLA (9th ed.) Citation

Jiang, Yi, et al. Enhancement Study of Electronic Component Size Measurement and Defect Detection Based on Machine Vision. AIP Publishing LLC, 2025.