APA (7th ed.) Citation

LI, Z., JIN, X., LIU, H., XU, X., & WANG, J. (2019). Global sensitivity analysis of wheat grain yield and quality and the related process variables from the DSSAT-CERES model based on the extended Fourier Amplitude Sensitivity Test method. KeAi Communications Co., Ltd.

Chicago Style (17th ed.) Citation

LI, Zhen-hai, Xiu-liang JIN, Hai-long LIU, Xin-gang XU, and Ji-hua WANG. Global Sensitivity Analysis of Wheat Grain Yield and Quality and the Related Process Variables from the DSSAT-CERES Model Based on the Extended Fourier Amplitude Sensitivity Test Method. KeAi Communications Co., Ltd, 2019.

MLA (9th ed.) Citation

LI, Zhen-hai, et al. Global Sensitivity Analysis of Wheat Grain Yield and Quality and the Related Process Variables from the DSSAT-CERES Model Based on the Extended Fourier Amplitude Sensitivity Test Method. KeAi Communications Co., Ltd, 2019.