Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy
Fourier ptychographic microscopy (FPM) is a recently developed microscope technology that overcomes the resolution limit of a low numerical aperture objective lens by employing angular varying illuminations. Combining the concepts of ptychography, synthetic aperture, and phase retrieval, FPM achieve...
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| Format: | Article |
| Language: | English |
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IEEE
2018-01-01
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| Series: | IEEE Photonics Journal |
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| Online Access: | https://ieeexplore.ieee.org/document/8166728/ |
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| author | Jizhou Zhang Tingfa Xu Jingdan Liu Sining Chen Xing Wang |
| author_facet | Jizhou Zhang Tingfa Xu Jingdan Liu Sining Chen Xing Wang |
| author_sort | Jizhou Zhang |
| collection | DOAJ |
| description | Fourier ptychographic microscopy (FPM) is a recently developed microscope technology that overcomes the resolution limit of a low numerical aperture objective lens by employing angular varying illuminations. Combining the concepts of ptychography, synthetic aperture, and phase retrieval, FPM achieves high-resolution, wide-field, and quantitative phase imaging at the same time. In typical FPM systems, the angular varying illuminations are achieved with LED arrays whose positional misalignments bring significant errors in the reconstruction procedure. In previous studies, several LED array alignment methods are developed, which iteratively recover the positional misalignment parameters during the reconstruction. These methods consume additional calculations in FPM reconstruction and may not be practical in other microscopy system. In this work, we represent a preprocessing LED array alignment method by accurately localizing the brightfield area on the sample plane. By applying particle swarm optimization method and random sample consensus method, the global misalignment parameters can be estimated with high accuracy and speed. Both numerical simulations and actual system experiments are carried out to evaluate the effectiveness of our method and the results show that the reconstruction quality of high-resolution images is significantly improved by using our method. |
| format | Article |
| id | doaj-art-a19f8c54fa7e43459ab0dea71e1943b8 |
| institution | Matheson Library |
| issn | 1943-0655 |
| language | English |
| publishDate | 2018-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-a19f8c54fa7e43459ab0dea71e1943b82025-07-01T23:35:07ZengIEEEIEEE Photonics Journal1943-06552018-01-0110111310.1109/JPHOT.2017.27801898166728Precise Brightfield Localization Alignment for Fourier Ptychographic MicroscopyJizhou Zhang0https://orcid.org/0000-0002-1015-0534Tingfa Xu1Jingdan Liu2Sining Chen3Xing Wang4School of Optoelectronics, Beijing Institute of Technology, Beijing, ChinaSchool of Optoelectronics, Beijing Institute of Technology, Beijing, ChinaAcademy of Opto-Electronics, Chinese Academy of Science, Beijing, ChinaSchool of Optoelectronics, Beijing Institute of Technology, Beijing, ChinaSchool of Optoelectronics, Beijing Institute of Technology, Beijing, ChinaFourier ptychographic microscopy (FPM) is a recently developed microscope technology that overcomes the resolution limit of a low numerical aperture objective lens by employing angular varying illuminations. Combining the concepts of ptychography, synthetic aperture, and phase retrieval, FPM achieves high-resolution, wide-field, and quantitative phase imaging at the same time. In typical FPM systems, the angular varying illuminations are achieved with LED arrays whose positional misalignments bring significant errors in the reconstruction procedure. In previous studies, several LED array alignment methods are developed, which iteratively recover the positional misalignment parameters during the reconstruction. These methods consume additional calculations in FPM reconstruction and may not be practical in other microscopy system. In this work, we represent a preprocessing LED array alignment method by accurately localizing the brightfield area on the sample plane. By applying particle swarm optimization method and random sample consensus method, the global misalignment parameters can be estimated with high accuracy and speed. Both numerical simulations and actual system experiments are carried out to evaluate the effectiveness of our method and the results show that the reconstruction quality of high-resolution images is significantly improved by using our method.https://ieeexplore.ieee.org/document/8166728/Coherence imagingmicroscopyimaging system. |
| spellingShingle | Jizhou Zhang Tingfa Xu Jingdan Liu Sining Chen Xing Wang Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy IEEE Photonics Journal Coherence imaging microscopy imaging system. |
| title | Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy |
| title_full | Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy |
| title_fullStr | Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy |
| title_full_unstemmed | Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy |
| title_short | Precise Brightfield Localization Alignment for Fourier Ptychographic Microscopy |
| title_sort | precise brightfield localization alignment for fourier ptychographic microscopy |
| topic | Coherence imaging microscopy imaging system. |
| url | https://ieeexplore.ieee.org/document/8166728/ |
| work_keys_str_mv | AT jizhouzhang precisebrightfieldlocalizationalignmentforfourierptychographicmicroscopy AT tingfaxu precisebrightfieldlocalizationalignmentforfourierptychographicmicroscopy AT jingdanliu precisebrightfieldlocalizationalignmentforfourierptychographicmicroscopy AT siningchen precisebrightfieldlocalizationalignmentforfourierptychographicmicroscopy AT xingwang precisebrightfieldlocalizationalignmentforfourierptychographicmicroscopy |