Riping, L., Yingting, L., Shiyu, L., Xianyang, Z., & Liqi, W. (2024). Partial discharge pattern recognition based on EEMD singular value entropy. National Computer System Engineering Research Institute of China.
Chicago Style (17th ed.) CitationRiping, Luo, Luo Yingting, Lai Shiyu, Zhao Xianyang, and Wang Liqi. Partial Discharge Pattern Recognition Based on EEMD Singular Value Entropy. National Computer System Engineering Research Institute of China, 2024.
MLA (9th ed.) CitationRiping, Luo, et al. Partial Discharge Pattern Recognition Based on EEMD Singular Value Entropy. National Computer System Engineering Research Institute of China, 2024.
Warning: These citations may not always be 100% accurate.