Synchrotron radiation of a single electron application for optical spectroradiometry

Objectives. The investigations of optical radiation sources and metrological detector characteristics in the infrared (IR), visible, and air ultraviolet (UV) spectral regions are partially based on the unique metrological properties of synchrotron radiation. The aim of this work is to develop a high...

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Main Authors: A. S. Sigov, E. R. Lazarenko, N. B. Golovanova, O. A. Minaeva, S. I. Anevsky, R. V. Minaev, P. Yu. Pushkin
Format: Article
Language:Russian
Published: MIREA - Russian Technological University 2023-10-01
Series:Российский технологический журнал
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Online Access:https://www.rtj-mirea.ru/jour/article/view/765
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_version_ 1839584691904053248
author A. S. Sigov
E. R. Lazarenko
N. B. Golovanova
O. A. Minaeva
S. I. Anevsky
R. V. Minaev
P. Yu. Pushkin
author_facet A. S. Sigov
E. R. Lazarenko
N. B. Golovanova
O. A. Minaeva
S. I. Anevsky
R. V. Minaev
P. Yu. Pushkin
author_sort A. S. Sigov
collection DOAJ
description Objectives. The investigations of optical radiation sources and metrological detector characteristics in the infrared (IR), visible, and air ultraviolet (UV) spectral regions are partially based on the unique metrological properties of synchrotron radiation. The aim of this work is to develop a high-precision method for determining the storage ring accelerated electron number with synchrotron radiation of a single electron to establish spectroradiometry and photometry units.Methods. By determining the number of accelerated electrons, any storage ring can be used to calculate the synchrotron radiation characteristics at wavelengths of many large then the critical wavelength in the visible, air UV, and IR regions of the spectrum. This makes it possible to determine the main metrological characteristics normalized to the number of electrons, such as luminous intensity, luminance, illuminance, radiant power, radiance, irradiance, etc., regardless of the energy of the electrons.Results. When applying the method for determining the number of accelerated electrons at low currents of the electronic storage ring, a total standard deviation of the number of accelerated electrons is less than 0.01% for an exposure range of the CCD matrix from 10−2 to 3 · 103 s in a wide dynamic range of 1−1010 electrons per orbit.Conclusions. The use of a CCD-based radiometer-comparator calibrated by responsivity on a synchrotron radiation source is particularly relevant in monitoring luminance contrast thresholds and spatial distribution of object and background brightness, as well as determining metrological characteristics of optoelectronic measuring instruments, including CCD cameras, radiometers, spectroradiometers and photometers.
format Article
id doaj-art-9ba776e5200e4c2f80c80313bc7ad02d
institution Matheson Library
issn 2782-3210
2500-316X
language Russian
publishDate 2023-10-01
publisher MIREA - Russian Technological University
record_format Article
series Российский технологический журнал
spelling doaj-art-9ba776e5200e4c2f80c80313bc7ad02d2025-08-03T19:48:04ZrusMIREA - Russian Technological UniversityРоссийский технологический журнал2782-32102500-316X2023-10-01115718010.32362/2500-316X-2023-11-5-71-80395Synchrotron radiation of a single electron application for optical spectroradiometryA. S. Sigov0E. R. Lazarenko1N. B. Golovanova2O. A. Minaeva3S. I. Anevsky4R. V. Minaev5P. Yu. Pushkin6MIREA – Russian Technological UniversityFederal Agency for Technical Regulation and Metrology (Rosstandart)MIREA – Russian Technological UniversityMIREA – Russian Technological UniversityMIREA – Russian Technological UniversityElektrostekloMIREA – Russian Technological UniversityObjectives. The investigations of optical radiation sources and metrological detector characteristics in the infrared (IR), visible, and air ultraviolet (UV) spectral regions are partially based on the unique metrological properties of synchrotron radiation. The aim of this work is to develop a high-precision method for determining the storage ring accelerated electron number with synchrotron radiation of a single electron to establish spectroradiometry and photometry units.Methods. By determining the number of accelerated electrons, any storage ring can be used to calculate the synchrotron radiation characteristics at wavelengths of many large then the critical wavelength in the visible, air UV, and IR regions of the spectrum. This makes it possible to determine the main metrological characteristics normalized to the number of electrons, such as luminous intensity, luminance, illuminance, radiant power, radiance, irradiance, etc., regardless of the energy of the electrons.Results. When applying the method for determining the number of accelerated electrons at low currents of the electronic storage ring, a total standard deviation of the number of accelerated electrons is less than 0.01% for an exposure range of the CCD matrix from 10−2 to 3 · 103 s in a wide dynamic range of 1−1010 electrons per orbit.Conclusions. The use of a CCD-based radiometer-comparator calibrated by responsivity on a synchrotron radiation source is particularly relevant in monitoring luminance contrast thresholds and spatial distribution of object and background brightness, as well as determining metrological characteristics of optoelectronic measuring instruments, including CCD cameras, radiometers, spectroradiometers and photometers.https://www.rtj-mirea.ru/jour/article/view/765synchrotron radiationresponsivity thresholdluminance contrastluminance spatial distributionmeasuring instruments
spellingShingle A. S. Sigov
E. R. Lazarenko
N. B. Golovanova
O. A. Minaeva
S. I. Anevsky
R. V. Minaev
P. Yu. Pushkin
Synchrotron radiation of a single electron application for optical spectroradiometry
Российский технологический журнал
synchrotron radiation
responsivity threshold
luminance contrast
luminance spatial distribution
measuring instruments
title Synchrotron radiation of a single electron application for optical spectroradiometry
title_full Synchrotron radiation of a single electron application for optical spectroradiometry
title_fullStr Synchrotron radiation of a single electron application for optical spectroradiometry
title_full_unstemmed Synchrotron radiation of a single electron application for optical spectroradiometry
title_short Synchrotron radiation of a single electron application for optical spectroradiometry
title_sort synchrotron radiation of a single electron application for optical spectroradiometry
topic synchrotron radiation
responsivity threshold
luminance contrast
luminance spatial distribution
measuring instruments
url https://www.rtj-mirea.ru/jour/article/view/765
work_keys_str_mv AT assigov synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry
AT erlazarenko synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry
AT nbgolovanova synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry
AT oaminaeva synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry
AT sianevsky synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry
AT rvminaev synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry
AT pyupushkin synchrotronradiationofasingleelectronapplicationforopticalspectroradiometry