Mathematical and Software for Determining the Error in Solving Metrological Analysis Problems
Introduction. Currently, work is underway to create specialized software systems designed for metrological synthesis and analysis. Such systems include a set of functional blocks for solving typical metrological tasks. One of these tasks is to determine the characteristics of the measured sample by...
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| Main Authors: | , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Saint Petersburg Electrotechnical University "LETI"
2024-12-01
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| Series: | Известия высших учебных заведений России: Радиоэлектроника |
| Subjects: | |
| Online Access: | https://re.eltech.ru/jour/article/view/956 |
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| Summary: | Introduction. Currently, work is underway to create specialized software systems designed for metrological synthesis and analysis. Such systems include a set of functional blocks for solving typical metrological tasks. One of these tasks is to determine the characteristics of the measured sample by means of a set of standards. For example, it is required to determine the thickness of a sample using X-ray spectral analysis based on knowledge about the characteristics of a set of standards and taking into account instrumental and methodological errors.Aim. Development of software and algorithmic support for standard functional blocks of a software system designed for metrological analysis, in terms of performing calculations of X-ray spectral analysis.Materials and methods. The functional block being developed in the G language and in the GNU Octave software system takes as input the type and characteristics of the distribution law of the instrumental error of the instrument, the values of the exposure dose of radiation for a set of standards and a sample, as well as the thickness of the standards. At the output, this unit outputs the result of measuring the thickness of the sample and its distribution law. Thus, the measurement result includes the instrumental error, the error of the approximation method, as well as the errors of the transformations.Results. The software and algorithmic support of typical functional blocks of a software system designed to perform calculations of X-ray spectral analysis has been developed. This software allows you to speed up metrological analysis for the task of determining the thickness of a sample based on a number of measurements of a set of standards. The correctness of the software and algorithmic support for typical functional blocks of the software system is confirmed by the examples given, which were implemented by the calculation method, as well as by testing the created software in the graphical programming environment in the G language, and in the GNU Octave software system.Conclusion. The developed software and algorithmic software will be used in software systems for metrological synthesis and analysis. |
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| ISSN: | 1993-8985 2658-4794 |