Fast detection method for IC card data integrity protection mechanism
This paper introduces the detection methods for data integrity protection mechanism of integrated circuit (IC) card. An improved power-off-testing theory is proposed aiming at the limitations and shortcomings of traditional single-command power-off detection methods, to detect and verify IC card tra...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | Chinese |
| Published: |
National Computer System Engineering Research Institute of China
2025-05-01
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| Series: | Dianzi Jishu Yingyong |
| Subjects: | |
| Online Access: | http://www.chinaaet.com/article/3000171622 |
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| Summary: | This paper introduces the detection methods for data integrity protection mechanism of integrated circuit (IC) card. An improved power-off-testing theory is proposed aiming at the limitations and shortcomings of traditional single-command power-off detection methods, to detect and verify IC card transaction protection mechanism during data recovery process. Using time statistics and power consumption statistics, the effective time zone for power-off testing is calculated to improve testing efficiency. Finally, the effectiveness of the fast detection method for data integrity protection mechanism is verified by experimental results. |
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| ISSN: | 0258-7998 |