APA (7th ed.) Citation

Abbas, S. M., Awan, W. A., Haider, M. I., & Mohamed, H. G. (2025). Stress-Strength Interference Model for the Optimization of Test Coupon Engineering for Microvia Reliability. IEEE.

Chicago Style (17th ed.) Citation

Abbas, Syed Mujahid, Wahaj Abbas Awan, Muhammad Imran Haider, and Heba G. Mohamed. Stress-Strength Interference Model for the Optimization of Test Coupon Engineering for Microvia Reliability. IEEE, 2025.

MLA (9th ed.) Citation

Abbas, Syed Mujahid, et al. Stress-Strength Interference Model for the Optimization of Test Coupon Engineering for Microvia Reliability. IEEE, 2025.