APA (7th ed.) Citation

Borovikov, S. M., Tsyrelchuk, N. I., Dick, S. S., & Shneiderov, E. N. (2019). Effectiveness of models of degradation of functional parameters for predicting the parametric reliability of semiconductor devices. Educational institution «Belarusian State University of Informatics and Radioelectronics».

Chicago Style (17th ed.) Citation

Borovikov, S. M., N. I. Tsyrelchuk, S. S. Dick, and E. N. Shneiderov. Effectiveness of Models of Degradation of Functional Parameters for Predicting the Parametric Reliability of Semiconductor Devices. Educational institution «Belarusian State University of Informatics and Radioelectronics», 2019.

MLA (9th ed.) Citation

Borovikov, S. M., et al. Effectiveness of Models of Degradation of Functional Parameters for Predicting the Parametric Reliability of Semiconductor Devices. Educational institution «Belarusian State University of Informatics and Radioelectronics», 2019.