Interconnection mechanism and strengthening behavior of nano-silver sintered joints for silicon carbide power module packaging: A combined EBSD and nanoindentation study

Investigating the interconnection and strengthening mechanisms of die-attach layers is instrumental for advancing die attach process toward low-pressure and, ultimately, pressureless sintering while maintaining reliability. This study compares the microstructure and micromechanical heterogeneity of...

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Bibliographic Details
Main Authors: Chao Gu, Xiao Hu, Xuyang Yan, Wei Chen, Junwei Chen, Kai Lu, Tao Wang, Guoqi Zhang, Jiajie Fan
Format: Article
Language:English
Published: Elsevier 2025-09-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785425017934
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