Single-event upset simulation and detection in configuration memory

Single-event upset simulation and detection in configuration memory

Single-event upsets (SEUs) from radiation strikes in configuration memory are potentially catastrophic due to their widespread effects. For field-programmable gate arrays (FPGAs), faults in configuration memory propagate into the implemented logic design at the hardware interconnection level, leadin...

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Bibliographic Details
Main Authors: Hezekiah Austin, Chris Major, Colter Barney, Justin Williams, Zachary Becker, Mackenzie Smith, Brock LaMeres
Format: Article
Language:English
Published: Frontiers Media S.A. 2025-07-01
Series:Frontiers in Space Technologies
Subjects:
configuration memory
radiation tolerance
FPGA
SEE
softcore
QMR
Online Access:https://www.frontiersin.org/articles/10.3389/frspt.2025.1610424/full
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