APA (7th ed.) Citation

Huang, J., Ariffin, S. A., Zhu, Q., Xu, W., & Yang, Q. (2025). SAMF-YOLO: A self-supervised, high-precision approach for defect detection in complex industrial environments. Public Library of Science (PLoS).

Chicago Style (17th ed.) Citation

Huang, Jun, Shamsul Arrieya Ariffin, Qiang Zhu, Wanting Xu, and Qun Yang. SAMF-YOLO: A Self-supervised, High-precision Approach for Defect Detection in Complex Industrial Environments. Public Library of Science (PLoS), 2025.

MLA (9th ed.) Citation

Huang, Jun, et al. SAMF-YOLO: A Self-supervised, High-precision Approach for Defect Detection in Complex Industrial Environments. Public Library of Science (PLoS), 2025.