APA (7th ed.) Citation

Son, D., So, H., Jung, J., Ko, Y., Shrivastava, A., & Lee, K. (2025). FRESH: Fully Reliable and Effective Protection Against Soft and Hard Errors. IEEE.

Chicago Style (17th ed.) Citation

Son, Daehoon, Hwisoo So, Jinhyo Jung, Yohan Ko, Aviral Shrivastava, and Kyoungwoo Lee. FRESH: Fully Reliable and Effective Protection Against Soft and Hard Errors. IEEE, 2025.

MLA (9th ed.) Citation

Son, Daehoon, et al. FRESH: Fully Reliable and Effective Protection Against Soft and Hard Errors. IEEE, 2025.