Evaluation methods of mechanical properties for low-k dielectrics

This review introduces the study of state-of-art methods for assessing the mechanical properties of insulating materials with low dielectric constant. The main features of measuring Young’s modulus of thin films insulating materials with low dielectric constant are determined by usage of Brillouin l...

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Bibliographic Details
Main Author: I. S. Ovchinnikov
Format: Article
Language:Russian
Published: MIREA - Russian Technological University 2021-06-01
Series:Российский технологический журнал
Subjects:
Online Access:https://www.rtj-mirea.ru/jour/article/view/326
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