Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices
We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the...
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Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2025-07-01
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Series: | Additive Manufacturing Letters |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2772369025000337 |
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Summary: | We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations. |
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ISSN: | 2772-3690 |