RETRACTED: A Comprehensive Review of Electron Microscopy in Materials Science: Technological Advances and Applications
This proceeding volume has been retracted from the publication because we found some solid reasons to believe that it has infringed our integrity criteria and now presents a risk for our journal and scholarly science in general. Different types of malpractice are involved, in particular citation man...
Saved in:
Main Authors: | Agrawal Manoj, Prasad VVSH, Nijhawan Ginni, Jalal Sarah Salah, Rajalakshmi B, Dwivedi Shashi Prakash |
---|---|
Format: | Article |
Language: | English |
Published: |
EDP Sciences
2024-01-01
|
Series: | E3S Web of Conferences |
Online Access: | https://www.e3s-conferences.org/articles/e3sconf/pdf/2024/35/e3sconf_icarae2023_01029.pdf |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
RETRACTED: Innovative Advances and Prospects in In Situ Materials Testing: A Comprehensive Review
by: Agrawal Manoj, et al.
Published: (2024-01-01) -
RETRACTED: Mechanical Characterization of Emerging 2D Materials for Electronics: Review
by: Lalitha G, et al.
Published: (2024-01-01) -
RETRACTED: High-Temperature Mechanical Characterization of Materials for Extreme Environments
by: Gupta Priyanka, et al.
Published: (2024-01-01) -
RETRACTED: Advanced Casting Techniques for Complex-Shaped Components: Design, Simulation and Process Control
by: Pant Gaurav, et al.
Published: (2023-01-01) -
Advances in optical and electron microscopy, vol.10 /
Published: (1987)