NORMALIZATION BASED ON THICKNESS AND PARAMETRIZATION OF CONTOUR LINES ON IMAGES
The method of normalization of planimetric lines on thickness based on the mask analysis of local orientations of their fragments is offered. Comparison of the offered method with known methods of a skeletization is made. It is shown that the offered method surpasses known methods of a skeletization...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/569 |
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