Thermal stability of FeSi as barrier layer in high-performance Mg2Si0.3Sn0.7 thermoelectric device

Thermal stability of thermoelectric devices plays a pivotal role in their practical applications. Chemical reaction/diffusion between thermoelectric materials and electrodes is one of the primary factors contributing to the degradation/failure of device performance at elevated temperatures. Introduc...

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Bibliographic Details
Main Authors: Shanshan Hu, Chen Huang, Changyuan Li, Long Yang, Zhiwei Chen, Baisheng Sa, Wen Li, Yanzhong Pei
Format: Article
Language:English
Published: Elsevier 2025-09-01
Series:Journal of Materiomics
Online Access:http://www.sciencedirect.com/science/article/pii/S2352847825000346
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