Comprehensive Eye Diagram Analysis: A Transfer Learning Approach
A deep transfer learning (TL)-based comprehensive eye diagram analysis and diagnosis scheme that can output essential eye diagram parameters, estimate fiber link length, calculate Q-factor, and diagnose device imperfection-induced impairments is proposed. TL can be used to extract system information...
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| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8871178/ |
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