Thermal resistance research of power devices based on structural function curve correction method

This study investigated the thermal resistance of various layers within power devices. To this end, thermal resistance tests were conducted on an IGBT module, leading to the plotting of its structural function curve. This module was then structurally modeled, and subsequent transient thermal simulat...

Full description

Saved in:
Bibliographic Details
Main Authors: WANG Yongzhi, ZHOU Wei, WEI Xiaohui, ZHOU Longfei, LIU Hongwei, GUO Weili
Format: Article
Language:Chinese
Published: Editorial Department of Electric Drive for Locomotives 2025-03-01
Series:机车电传动
Subjects:
Online Access:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128X.2025.02.103
Tags: Add Tag
No Tags, Be the first to tag this record!