Surface Charging on Insulating Films with Different Thicknesses in UPS
The conventional view holds that ultraviolet photoelectron spectroscopy (UPS) measurements are not applicable to insulating materials due to interference from charging effects. To avoid surface charging, researchers typically restrict valence band structure investigations to ultra-thin films. Howeve...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/12/6846 |
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