Knowledge-Graph-Driven Fault Diagnosis Methods for Intelligent Production Lines

In order to enhance the management and application of fault knowledge within intelligent production lines, thereby increasing the efficiency of fault diagnosis and ensuring the stable and reliable operation of these systems, we propose a fault diagnosis methodology that leverages knowledge graphs. F...

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Bibliographic Details
Main Authors: Yanjun Chen, Min Zhou, Meizhou Zhang, Meng Zha
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/13/3912
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