Pakkathillam, J. K., Haack, J., & Zoughi, R. (2025). Millimeter-Wave Reflectometry for Detecting Graphite Contamination in Titanium (Ti64) Powder Used in Additive Manufacturing (AM). IEEE.
Chicago Style (17th ed.) CitationPakkathillam, Jayaram Kizhekke, Jessica Haack, and Reza Zoughi. Millimeter-Wave Reflectometry for Detecting Graphite Contamination in Titanium (Ti64) Powder Used in Additive Manufacturing (AM). IEEE, 2025.
MLA (9th ed.) CitationPakkathillam, Jayaram Kizhekke, et al. Millimeter-Wave Reflectometry for Detecting Graphite Contamination in Titanium (Ti64) Powder Used in Additive Manufacturing (AM). IEEE, 2025.
Warning: These citations may not always be 100% accurate.