Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films

In this study, we prepared thin films of nickel oxide with a thickness of 150±10 nm using the pyrolysis spray technique, and their properties were studied for two hours at different annealing temperatures. including (as deposited, 723 and 873) K. Based on XRD measurements, the pattern data showed t...

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Main Authors: Shatha. F. Abbas, Hiba M. Ali
Format: Article
Language:English
Published: University of Baghdad 2025-07-01
Series:Ibn Al-Haitham Journal for Pure and Applied Sciences
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Online Access:https://jih.uobaghdad.edu.iq/index.php/j/article/view/4073
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author Shatha. F. Abbas
Hiba M. Ali
author_facet Shatha. F. Abbas
Hiba M. Ali
author_sort Shatha. F. Abbas
collection DOAJ
description In this study, we prepared thin films of nickel oxide with a thickness of 150±10 nm using the pyrolysis spray technique, and their properties were studied for two hours at different annealing temperatures. including (as deposited, 723 and 873) K. Based on XRD measurements, the pattern data showed that (NiO) had an amorphous structure without annealing, but that a cubic polycrystalline structure with a preferred orientation (111), (200), and (220) was produced at a higher annealing temperature. In addition to other techniques, the crystal structure of the film was characterized using X-ray diffraction. The structure and physical characteristics of the NiO thin films are examined using methods based on atomic force microscopy and X-rays. techniques are employed to examine the surface morphology of layers of nickel oxide. As the temperature of annealing increased, the study reported mean diameter, roughness of surface, and particle size mutation values (186.0–254 nm). The wavelength range of (300-1000) nm is also taken into consideration when further examining and reporting transmittance and absorbance spectra, demonstrating various deviations from the nominal values. The results show that a treatment of temperature 873 K produced the sample's maximum absorbance value. The findings indicate that direct transitions are allowed in the thin films under study at optical energies of (3.57, 3.51, and 3.47) eV, respectively.
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spelling doaj-art-1e00905c7c9b43888a32c2e87ecb0c8c2025-07-21T03:50:21ZengUniversity of BaghdadIbn Al-Haitham Journal for Pure and Applied Sciences1609-40422521-34072025-07-0138310.30526/38.3.4073Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin FilmsShatha. F. Abbas0https://orcid.org/0009-0003-9588-5314Hiba M. Ali1https://orcid.org/0000-0002-2660-2523Department of Physics, College of Education for Pure Science (Ibn Al-Haitham), University of Baghdad, Baghdad, Iraq. Department of Physics, College of Education for Pure Science (Ibn Al-Haitham), University of Baghdad, Baghdad, Iraq. In this study, we prepared thin films of nickel oxide with a thickness of 150±10 nm using the pyrolysis spray technique, and their properties were studied for two hours at different annealing temperatures. including (as deposited, 723 and 873) K. Based on XRD measurements, the pattern data showed that (NiO) had an amorphous structure without annealing, but that a cubic polycrystalline structure with a preferred orientation (111), (200), and (220) was produced at a higher annealing temperature. In addition to other techniques, the crystal structure of the film was characterized using X-ray diffraction. The structure and physical characteristics of the NiO thin films are examined using methods based on atomic force microscopy and X-rays. techniques are employed to examine the surface morphology of layers of nickel oxide. As the temperature of annealing increased, the study reported mean diameter, roughness of surface, and particle size mutation values (186.0–254 nm). The wavelength range of (300-1000) nm is also taken into consideration when further examining and reporting transmittance and absorbance spectra, demonstrating various deviations from the nominal values. The results show that a treatment of temperature 873 K produced the sample's maximum absorbance value. The findings indicate that direct transitions are allowed in the thin films under study at optical energies of (3.57, 3.51, and 3.47) eV, respectively. https://jih.uobaghdad.edu.iq/index.php/j/article/view/4073Nickel oxideAnnealed temperatureX-ray diffractionCharacteristic optical
spellingShingle Shatha. F. Abbas
Hiba M. Ali
Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films
Ibn Al-Haitham Journal for Pure and Applied Sciences
Nickel oxide
Annealed temperature
X-ray diffraction
Characteristic optical
title Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films
title_full Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films
title_fullStr Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films
title_full_unstemmed Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films
title_short Impact of Annealing on Optical and Structural Analysis of Chemically Spray-Prepared Nickel Oxide Thin Films
title_sort impact of annealing on optical and structural analysis of chemically spray prepared nickel oxide thin films
topic Nickel oxide
Annealed temperature
X-ray diffraction
Characteristic optical
url https://jih.uobaghdad.edu.iq/index.php/j/article/view/4073
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