Application of wavelet-analysis for image filtration in electronic and probe microscopy
The review presents the results of application of the programs of discrete and stationary wavelet-analysis for filtration of object image from noise and for the increase of its resolution capability in electronic and probe microscopy.
Saved in:
Main Authors: | N. P. Konnov, Yu. P. Volkov, M. N. Kireev, O. S. Kuznetsov |
---|---|
Format: | Article |
Language: | Russian |
Published: |
Federal Government Health Institution, Russian Research Anti-Plague Institute “Microbe”
2008-06-01
|
Series: | Проблемы особо опасных инфекций |
Subjects: | |
Online Access: | https://journal.microbe.ru/jour/article/view/1042 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Modern Technologies for Examination of Three-Dimensional (3-D) Ultra-Fine Structure and Visualization of Microorganisms
by: N. P. Konnov, et al.
Published: (2012-04-01) -
Electron microscopy /
by: Kopp, Friedrich
Published: (1981) -
Scanning electron microscopy : applications to materials and device science /
by: Thorton, P. R.
Published: (1968) -
Introduction to electron microscopy /
by: Wischnitzer, Saul
Published: (1962) -
Introduction to electron microscopy /
by: Hall, Cecil E.
Published: (1966)