Memristor Effect in Layered Film Structures
Equivalent electrical circuits of multilayer film structures with memristor switching of resistance at interlayer boundaries and at the boundaries of crystal grains in each layer are proposed. Numerical modeling of the current-voltage characteristics of such structures has shown that...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2024-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/3925 |
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| Summary: | Equivalent electrical circuits of multilayer film structures with memristor switching of resistance at interlayer boundaries and at the boundaries of crystal grains in each layer are proposed. Numerical modeling of the current-voltage characteristics of such structures has shown that their loop-shaped form, typical of memristors, is transformed into a linear ohmic dependence of the total current on the magnitude of the applied external voltage as both the number of layers and the number of grains in each layer increase. A certain combination of the number of layers and grains in a layer has been established, at which the maximum total current flowing through the structure and the ratio of resistances in the “off” and “on” states reach the highest values. |
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| ISSN: | 1729-7648 |