Principles and Applications of Liquid‐Environment Atomic Force Microscopy
Abstract Liquid environment is essential for the occurrence of various vital processes in fields of chemistry, biology, mechanics, and so on, underscoring the importance of understanding the solid–liquid interfaces. In the past decades, liquid‐environment atomic force microscopy (LE‐AFM) has played...
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Language: | English |
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Wiley-VCH
2022-12-01
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Series: | Advanced Materials Interfaces |
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Online Access: | https://doi.org/10.1002/admi.202201864 |
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author | Xinhai Chen Baowen Li Zixuan Liao Jidong Li Xuemei Li Jun Yin Wanlin Guo |
author_facet | Xinhai Chen Baowen Li Zixuan Liao Jidong Li Xuemei Li Jun Yin Wanlin Guo |
author_sort | Xinhai Chen |
collection | DOAJ |
description | Abstract Liquid environment is essential for the occurrence of various vital processes in fields of chemistry, biology, mechanics, and so on, underscoring the importance of understanding the solid–liquid interfaces. In the past decades, liquid‐environment atomic force microscopy (LE‐AFM) has played a nonsubstitutable role in studying solid–liquid interfaces because of its sub‐nanometer spatial resolution, video‐level imaging rates as well as piconewton‐level force measuring capabilities. Various state‐of‐the‐art developments and exciting applications are made recently. In this review, following a brief discussion on the development history of LE‐AFM, its working principles and operating modes with an emphasis on challenges posed by liquid environments and the corresponding solutions are introduced. As tip–sample interactions set the basis of all kinds of AFM, the interactions between the tip and the sample in liquid, including long‐range DLVO forces with quantitative description and short‐range non‐DLVO, whose physical origination is, by contrast, still in ambiguous, are elaborated. The applications of LE‐AFM are then summarized in four aspects, including high‐resolution imaging, high‐speed imaging, tribological characterization, and force spectroscopy‐based characterization. Finally, the perspectives on the future developing direction of LE‐AFM are shared. |
format | Article |
id | doaj-art-0f7f6f28c7074e059d69a92f1c4669b5 |
institution | Matheson Library |
issn | 2196-7350 |
language | English |
publishDate | 2022-12-01 |
publisher | Wiley-VCH |
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series | Advanced Materials Interfaces |
spelling | doaj-art-0f7f6f28c7074e059d69a92f1c4669b52025-07-04T08:30:18ZengWiley-VCHAdvanced Materials Interfaces2196-73502022-12-01935n/an/a10.1002/admi.202201864Principles and Applications of Liquid‐Environment Atomic Force MicroscopyXinhai Chen0Baowen Li1Zixuan Liao2Jidong Li3Xuemei Li4Jun Yin5Wanlin Guo6Key Laboratory for Intelligent Nano Materials and Devices of the Ministry of Education State Key Laboratory of Mechanics and Control of Mechanical Structures College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaKey Laboratory for Intelligent Nano Materials and Devices of the Ministry of Education State Key Laboratory of Mechanics and Control of Mechanical Structures College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaKey Laboratory for Intelligent Nano Materials and Devices of the Ministry of Education State Key Laboratory of Mechanics and Control of Mechanical Structures College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaInstitute for Frontier Science Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaCollege of Material Science and Engineering Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaKey Laboratory for Intelligent Nano Materials and Devices of the Ministry of Education State Key Laboratory of Mechanics and Control of Mechanical Structures College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaKey Laboratory for Intelligent Nano Materials and Devices of the Ministry of Education State Key Laboratory of Mechanics and Control of Mechanical Structures College of Aerospace Engineering Nanjing University of Aeronautics and Astronautics Nanjing 210016 P. R. ChinaAbstract Liquid environment is essential for the occurrence of various vital processes in fields of chemistry, biology, mechanics, and so on, underscoring the importance of understanding the solid–liquid interfaces. In the past decades, liquid‐environment atomic force microscopy (LE‐AFM) has played a nonsubstitutable role in studying solid–liquid interfaces because of its sub‐nanometer spatial resolution, video‐level imaging rates as well as piconewton‐level force measuring capabilities. Various state‐of‐the‐art developments and exciting applications are made recently. In this review, following a brief discussion on the development history of LE‐AFM, its working principles and operating modes with an emphasis on challenges posed by liquid environments and the corresponding solutions are introduced. As tip–sample interactions set the basis of all kinds of AFM, the interactions between the tip and the sample in liquid, including long‐range DLVO forces with quantitative description and short‐range non‐DLVO, whose physical origination is, by contrast, still in ambiguous, are elaborated. The applications of LE‐AFM are then summarized in four aspects, including high‐resolution imaging, high‐speed imaging, tribological characterization, and force spectroscopy‐based characterization. Finally, the perspectives on the future developing direction of LE‐AFM are shared.https://doi.org/10.1002/admi.202201864applicationsatomic force microscopyliquid environmentstip–sample interactionsworking principle |
spellingShingle | Xinhai Chen Baowen Li Zixuan Liao Jidong Li Xuemei Li Jun Yin Wanlin Guo Principles and Applications of Liquid‐Environment Atomic Force Microscopy Advanced Materials Interfaces applications atomic force microscopy liquid environments tip–sample interactions working principle |
title | Principles and Applications of Liquid‐Environment Atomic Force Microscopy |
title_full | Principles and Applications of Liquid‐Environment Atomic Force Microscopy |
title_fullStr | Principles and Applications of Liquid‐Environment Atomic Force Microscopy |
title_full_unstemmed | Principles and Applications of Liquid‐Environment Atomic Force Microscopy |
title_short | Principles and Applications of Liquid‐Environment Atomic Force Microscopy |
title_sort | principles and applications of liquid environment atomic force microscopy |
topic | applications atomic force microscopy liquid environments tip–sample interactions working principle |
url | https://doi.org/10.1002/admi.202201864 |
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