Analysis and application of electrostatic discharge testing standards for device level charged device models
This article summarizes, analyzes, and interprets the main testing standards for electrostatic discharge of device level charged device models (CDM) both domestically and internationally. The differences and correlations between various standards were sorted out, and the application scope and techni...
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Main Authors: | Jiang Hui, Tang Zhen, Wang Qianqian, Wan Yongkang, Yu Yongjian |
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Format: | Article |
Language: | Chinese |
Published: |
National Computer System Engineering Research Institute of China
2025-04-01
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Series: | Dianzi Jishu Yingyong |
Subjects: | |
Online Access: | http://www.chinaaet.com/article/3000171270 |
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