APA (7th ed.) Citation

Hui, J., Zhen, T., Qianqian, W., Yongkang, W., & Yongjian, Y. (2025). Analysis and application of electrostatic discharge testing standards for device level charged device models. National Computer System Engineering Research Institute of China.

Chicago Style (17th ed.) Citation

Hui, Jiang, Tang Zhen, Wang Qianqian, Wan Yongkang, and Yu Yongjian. Analysis and Application of Electrostatic Discharge Testing Standards for Device Level Charged Device Models. National Computer System Engineering Research Institute of China, 2025.

MLA (9th ed.) Citation

Hui, Jiang, et al. Analysis and Application of Electrostatic Discharge Testing Standards for Device Level Charged Device Models. National Computer System Engineering Research Institute of China, 2025.