In-Situ Mechanical Testing of Nano-Component in TEM
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| Main Authors: | , |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/34893 |
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| _version_ | 1839566276293296128 |
|---|---|
| author | Sumigawa, Takashi Kitamura, Takayuki |
| author_facet | Sumigawa, Takashi Kitamura, Takayuki |
| author_sort | Sumigawa, Takashi |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/36597 |
| first_indexed | 2025-08-04T22:38:30Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-34893</identifier><datestamp>2012-04-04</datestamp>
<dc:title>In-Situ Mechanical Testing of Nano-Component in TEM</dc:title>
<dc:creator>Takashi Sumigawa</dc:creator>
<dc:creator>Takayuki Kitamura</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2012-04-04</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/34893</dc:identifier>
<dc:identifier>doi:10.5772/36597</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-51-0450-6</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/1508 ; The Transmission Electron Microscope</dc:source>
</oai_dc:dc> |
| id | InTech-34893 |
| institution | Matheson Library |
| isbn | 978-953-51-0450-6 |
| language | English |
| last_indexed | 2025-08-04T22:38:30Z |
| publishDate | 2012 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-348932012-04-04 In-Situ Mechanical Testing of Nano-Component in TEM Takashi Sumigawa Takayuki Kitamura Physical Sciences, Engineering and Technology None IntechOpen 2012-04-04 Chapter, Part Of Book https://www.intechopen.com/chapters/34893 doi:10.5772/36597 en ISBN:978-953-51-0450-6 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/1508 ; The Transmission Electron Microscope |
| spellingShingle | Physical Sciences, Engineering and Technology Sumigawa, Takashi Kitamura, Takayuki In-Situ Mechanical Testing of Nano-Component in TEM |
| title | In-Situ Mechanical Testing of Nano-Component in TEM |
| title_full | In-Situ Mechanical Testing of Nano-Component in TEM |
| title_fullStr | In-Situ Mechanical Testing of Nano-Component in TEM |
| title_full_unstemmed | In-Situ Mechanical Testing of Nano-Component in TEM |
| title_short | In-Situ Mechanical Testing of Nano-Component in TEM |
| title_sort | in situ mechanical testing of nano component in tem |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/34893 |
| work_keys_str_mv | AT sumigawatakashi insitumechanicaltestingofnanocomponentintem AT kitamuratakayuki insitumechanicaltestingofnanocomponentintem |