Selvaraj, S. L., & Egawa, T. (2012). Transmission Electron Microscopy to Study Gallium Nitride Transistors Grown on Sapphire and Silicon Substrates. IntechOpen. https://doi.org/10.5772/35876
Chicago Style (17th ed.) CitationSelvaraj, S. Lawrence, and Takashi Egawa. Transmission Electron Microscopy to Study Gallium Nitride Transistors Grown on Sapphire and Silicon Substrates. IntechOpen, 2012. https://doi.org/10.5772/35876.
MLA (9th ed.) CitationSelvaraj, S. Lawrence, and Takashi Egawa. Transmission Electron Microscopy to Study Gallium Nitride Transistors Grown on Sapphire and Silicon Substrates. IntechOpen, 2012. https://doi.org/10.5772/35876.
Warning: These citations may not always be 100% accurate.