MEMS Characterization Based on Optical Measuring Methods
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| 主要な著者: | , , |
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| フォーマット: | 電子媒体 図書の章 |
| 言語: | 英語 |
| 出版事項: |
IntechOpen
2012
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| 主題: | |
| オンライン･アクセス: | https://www.intechopen.com/chapters/33591 |
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| _version_ | 1839564517118312448 |
|---|---|
| author | Guo, Tong Ma, Long Bian, Yan |
| author_facet | Guo, Tong Ma, Long Bian, Yan |
| author_sort | Guo, Tong |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/27524 |
| first_indexed | 2025-08-04T22:10:33Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-33591</identifier><datestamp>2012-03-28</datestamp>
<dc:title>MEMS Characterization Based on Optical Measuring Methods</dc:title>
<dc:creator>Tong Guo</dc:creator>
<dc:creator>Long Ma</dc:creator>
<dc:creator>Yan Bian</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2012-03-28</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/33591</dc:identifier>
<dc:identifier>doi:10.5772/27524</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-51-0306-6</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/853 ; Microelectromechanical Systems and Devices</dc:source>
</oai_dc:dc> |
| id | InTech-33591 |
| institution | Matheson Library |
| isbn | 978-953-51-0306-6 |
| language | English |
| last_indexed | 2025-08-04T22:10:33Z |
| publishDate | 2012 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-335912012-03-28 MEMS Characterization Based on Optical Measuring Methods Tong Guo Long Ma Yan Bian Physical Sciences, Engineering and Technology None IntechOpen 2012-03-28 Chapter, Part Of Book https://www.intechopen.com/chapters/33591 doi:10.5772/27524 en ISBN:978-953-51-0306-6 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/853 ; Microelectromechanical Systems and Devices |
| spellingShingle | Physical Sciences, Engineering and Technology Guo, Tong Ma, Long Bian, Yan MEMS Characterization Based on Optical Measuring Methods |
| title | MEMS Characterization Based on Optical Measuring Methods |
| title_full | MEMS Characterization Based on Optical Measuring Methods |
| title_fullStr | MEMS Characterization Based on Optical Measuring Methods |
| title_full_unstemmed | MEMS Characterization Based on Optical Measuring Methods |
| title_short | MEMS Characterization Based on Optical Measuring Methods |
| title_sort | mems characterization based on optical measuring methods |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/33591 |
| work_keys_str_mv | AT guotong memscharacterizationbasedonopticalmeasuringmethods AT malong memscharacterizationbasedonopticalmeasuringmethods AT bianyan memscharacterizationbasedonopticalmeasuringmethods |